Title :
A highly portable, self-stimulating and self-testing reliability test chip for ASIC products
Author :
Erhart, David L. ; Colunga, Tomas ; Lopez, David
Author_Institution :
Motorola, Inc., Chandler, AZ, USA
Abstract :
The use of a highly portable ASIC design, a reliability test chip (RTC), that has been successfully used for the reliability assessment of two generations of CMOS products is described. The RTC design has many features that make it an excellent vehicle for performing silicon process and package reliability qualifications. This design comprises a repetitive megacell-based core that is supported by a standardized vector generator and verification circuitry. The standardization of the design allows easy portability to various base array sizes and new silicon process technologies
Keywords :
CMOS logic circuits; application specific integrated circuits; built-in self test; cellular arrays; integrated circuit design; integrated circuit packaging; integrated circuit reliability; integrated circuit testing; logic testing; CMOS products; highly portable ASIC design; logic megacell; package reliability; repetitive megacell-based core; self-stimulating; self-testing reliability test chip; standardized vector generator; verification circuitry; Application specific integrated circuits; Automatic testing; Built-in self-test; Extrapolation; Life testing; Product design; Qualifications; Silicon; Stress; Vehicles;
Conference_Titel :
ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-1375-5
DOI :
10.1109/ASIC.1993.410830
