• DocumentCode
    1599952
  • Title

    High-power and high-speed semiconductor switch RSD applied in pulsed power system

  • Author

    Liang, Lin ; Yu, Yuehui ; Deng, Linfeng ; Peng, Yabin

  • Author_Institution
    Dept. of Electron. Sci. & Technol., Huazhong Univ. of Sci. & Technol., Wuhan
  • fYear
    2007
  • Firstpage
    691
  • Lastpage
    694
  • Abstract
    Based on the controllable plasma layer conversion principle, the new-type semiconductor pulsed power switch reversely switched dynistor (RSD) turns on uniformly and simultaneously over the whole chip area. It has the advantages of high power and high speed at the same time. The blocking, turn-on and turn-off characteristics of RSD are investigated in this paper systematically. The off-state and on-state characteristics get a trade-off by an optimal design method. The equations during turn-on and turn-off process are obtained by analyzing the carrier motion on different conditions. Then two important parameters, the turn-on voltage and reverse recovery time, are calculated. In the single pulse experiment, peak currents of 21.6 kA and 42.0 kA (pulse widths of 30 mus and 200 mus) are acquired on 20 mm and 40 mm diameter stacks respectively, which have reached the utmost value. In the repetitive frequency experiment, output waveform of 20 Hz is acquired at 4 kV with a resonant triggering way.
  • Keywords
    pulsed power switches; semiconductor switches; current 21.6 kA; current 42.0 kA; frequency 20 Hz; plasma layer conversion principle; pulsed power system; resonant triggering; semiconductor pulsed power switch reversely switched dynistor; size 20 mm; size 40 mm; time 200 mus; time 30 mus; voltage 4 kV; Design methodology; Differential equations; Frequency; Motion analysis; Plasma properties; Power semiconductor switches; Pulse power systems; Resonance; Space vector pulse width modulation; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics, 2007. ICPE '07. 7th Internatonal Conference on
  • Conference_Location
    Daegu
  • Print_ISBN
    978-1-4244-1871-8
  • Electronic_ISBN
    978-1-4244-1872-5
  • Type

    conf

  • DOI
    10.1109/ICPE.2007.4692476
  • Filename
    4692476