• DocumentCode
    1600096
  • Title

    Optimal plane-wave representation of random fields in a reverberation chamber

  • Author

    West, J.C. ; Bunting, C.F. ; Rajamani, V.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
  • fYear
    2011
  • Firstpage
    208
  • Lastpage
    213
  • Abstract
    The random electromagnetic field within a reverberation chamber is modeled using a superposition of plane waves. Based on rigorous sampling theory, the ideal continuous plane-wave spectrum within the chamber is sampled over the sphere to yield nearly ideal field statistics (including spatial autocorrelation) over a specified test volume such as that occupied by an equipment under test (EUT). The same spectral sampling (as defined by the individual plane-wave directions) is used for each trial, with randomness added to the specific fields associated with the individual plane-wave samples in the different trials. Since the sampling is fixed, the response of the EUT to only a single plane wave at each sample point must be found numerically. The response of the EUT to specific realizations of random fields within the chamber is found through a linear superposition of the individual plane-wave responses weighted by appropriate random coefficients. This minimizes the number of times the field on the EUT must be solved using a numerical electromagnetics technique, giving an efficient method to numerically simulate susceptibility tests within reverberation chambers.
  • Keywords
    computational electromagnetics; correlation methods; electromagnetic fields; continuous plane wave spectrum; equipment under test; numerical electromagnetics technique; optimal plane wave representation; random electromagnetic field; random fields; reverberation chamber; rigorous sampling theory; spatial autocorrelation; specified test volume; Bandwidth; Computational electromagnetics; Computational modeling; Correlation; Numerical models; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
  • Conference_Location
    Long Beach, CA, USA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4577-0812-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2011.6038311
  • Filename
    6038311