DocumentCode
160013
Title
Mechanical characterization of bond wire materials in electronic devices at elevated temperatures
Author
Lorenz, G. ; Naumann, Felix ; Mittag, M. ; Petzold, M.
Author_Institution
Center for Appl. Microstructure diagnostics, Fraunhofer Inst. for Mech. of Mater. IWM, Halle, Germany
fYear
2014
fDate
16-18 Sept. 2014
Firstpage
1
Lastpage
6
Abstract
Today, micro- and power electronic components are used within a rapidly increasing number of different automotive applications playing a key role within power generation and energy conversion systems. As a consequence, particularly the interconnecting materials of electronics systems are extremely challenged by harsh environment conditions like high operational temperatures, which are partially superposed by intensive mechanical loading and high thermo mechanical stresses. In order to meet the robustness and reliability demands required for industrial applications, detailed understanding of the material response regarding (visco-) elastic, plastic or creep deformation behavior as a function of temperature is necessary. In this study, elastic and plastic material properties of bond wire materials at temperatures up to 350°C have been determined by nanoindentation. Using a Voce model to consider the plastic material behavior, the applied material parameter extraction procedure was exemplarily demonstrated for three different heavy bond wire materials as a model system. The test method presented has been validated by comparing results from reference tensile testing with the deformation behavior gained from nanoindentation testing. Thus, the testing method and data evaluation procedure can also be applied to determine local material parameters in critical process- or application-affected regions of microelectronic packaging materials.
Keywords
integrated circuit packaging; integrated circuit reliability; lead bonding; Voce model; applied material parameter extraction procedure; automotive applications; bond wire materials; creep deformation behavior; critical process; data evaluation procedure; elastic deformation behavior; elastic material properties; electronic devices; energy conversion systems; industrial applications; interconnecting materials; local material parameters; material response; mechanical characterization; mechanical loading; microelectronic components; microelectronic packaging materials; plastic deformation behavior; plastic material properties; power electronic components; power generation; reference tensile testing; reliability demands; testing method; thermomechanical stresses; Plastics; Strain; Stress; Temperature measurement; Testing; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics System-Integration Technology Conference (ESTC), 2014
Conference_Location
Helsinki
Type
conf
DOI
10.1109/ESTC.2014.6962748
Filename
6962748
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