Title :
Flicker removal for CMOS wide dynamic range imaging based on alternating current component analysis
Author :
Yoonjong Yoo ; Jaehyun Im ; Joonki Paik
Author_Institution :
Dept. of Image, Chung-Ang Univ., Seoul, South Korea
Abstract :
This paper presents a novel wide dynamic range system to reduce flickering artifact produced by a high speed electronic rolling shutter in a CMOS image sensor. The proposed algorithm removes flicker artifact in the shortexposure image using a correlation between the pair of two differently exposed images to extend the dynamic range. Since the proposed method overcomes the electronic shutter problem in a conventional wide dynamic range imaging system, it can remove the flicker artifact under an alternating current light source such as a fluorescent bulb.
Keywords :
CMOS image sensors; flicker noise; interference suppression; CMOS image sensor; CMOS wide dynamic range imaging; alternating current component analysis; alternating current light source; electronic rolling shutter; flickering artifact reduction; short exposure image; Brightness; CMOS image sensors; CMOS integrated circuits; Cameras; Dynamic range; Light sources; Alternating current analysis; CMOS WDR system; Flicker removal; Wide dynamic range (WDR);
Journal_Title :
Consumer Electronics, IEEE Transactions on
DOI :
10.1109/TCE.2014.6937311