Defect reduction in VSE-methodology and results

Author

Buczilowski, Harald

Author_Institution

VSE Base Product Dev. 1, IBM Boeblingen Programming Lab., Germany

fYear

1995

Firstpage

274

Lastpage

277

Abstract

In 1990 and 1991 activities have been defined to improve the quality of VSE, one of IBM´s operating systems. As a first step, all defects of the past 10 years of the VSE supervisor have been analysed and categorized using the Orthogonal Defect Classification system. This analysis and an additional review of the development process lead to improvements in the areas of defect prevention and quality tracking. The result of these improvements is very encouraging: the defect rate of VSE has been reduced by 94% compared to 1989

Keywords

IBM computers; program testing; software quality; software reliability; supervisory programs; IBM operating system; Orthogonal Defect Classification system; VSE supervisor; defect prevention; defect rate; defect reduction; quality tracking; Assembly; Ducts; Feedback; Operating systems; Power line communications; Product development; Prototypes; Six sigma; Software quality; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Software Reliability Engineering, 1995. Proceedings., Sixth International Symposium on

Conference_Location

Toulouse

ISSN

1071-9458

Print_ISBN

0-8186-7131-9

Type

conf

DOI

10.1109/ISSRE.1995.497667

Filename

497667

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1600691