DocumentCode :
1600701
Title :
Effects of coverage factor, inhomogeneous broadening and cavity length on static and dynamic behavior of self-assembled quantum-dot laser by using circuit-level modeling
Author :
Razm-Pa, M. ; Emami, Farzin
Author_Institution :
Electron. Dept., Islamic Azad Univ., Boushehr, Iran
fYear :
2013
Firstpage :
55
Lastpage :
58
Abstract :
In this paper, a new circuit model for self-assembled quantum dot (SAQD) laser made by InGaAs/GaAs structures is presented based on the excited state and the standard rate equations. The model improves the previously offered circuit models and also provides and investigates the performance of this kind of laser. The effects of QDs coverage factor, inhomogeneous broadening, which its physical source is the size fluctuation of quantum dot in forming self assembled quantum dots, as well as cavity length, on SAQD laser have been analyzed. The results of simulation show that the increase of cavity length as well as the increase of QDs coverage causes the output power to increase. On the other hand, the coverage factor increase and the inhomogeneous broadening degradation lead to increase the modulation band width.
Keywords :
III-V semiconductors; equivalent circuits; excited states; gallium arsenide; indium compounds; laser cavity resonators; optical modulation; quantum dot lasers; self-assembly; semiconductor device models; spectral line broadening; InGaAs-GaAs; SAQD laser; cavity length; circuit-level modeling; coverage factor; dynamic behavior; excited state; inhomogeneous broadening degradation; laser output power; modulation bandwidth; physical source; self-assembled quantum-dot laser; size fluctuation; standard rate equations; static behavior; Integrated circuit modeling; Laser excitation; Laser modes; Mathematical model; Nonhomogeneous media; Power generation; Quantum dot lasers; broedening factor; coverage factor; equivalent circuit modeling; quantum dot lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices (CDE), 2013 Spanish Conference on
Conference_Location :
Valladolid
Print_ISBN :
978-1-4673-4666-5
Electronic_ISBN :
978-1-4673-4667-2
Type :
conf
DOI :
10.1109/CDE.2013.6481341
Filename :
6481341
Link To Document :
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