DocumentCode
160092
Title
Semi-additive Cu-polymer RDL process for interposers applications
Author
Duval, F.F.C. ; Detalle, Mikael ; Sun, Xinghua ; Beyne, Eric ; Neve, Cesar Roda ; Velenis, Dimitrios
Author_Institution
Imec, Leuven, Belgium
fYear
2014
fDate
16-18 Sept. 2014
Firstpage
1
Lastpage
6
Abstract
This paper explores the possibility to use insulating spin-on dielectric materials for 2.5D interposers. Up to 7 photosensitive materials have been investigated in terms of minimum line/space and via resolution to determine the maximum wiring density. In addition the electrical performances of the best materials were assessed in DC and RF to extract the dielectric constant and loss tangent. Finally the polymer semi-additive process was compared to a Damascene technology using the Wide I/O 2 as case study. The overall performances of each technology are assessed in terms of electrical performances, cost of ownership and wafer bowing. It was shown that the semiadditive process can compete with a conventional Damascene process. The best performing material is a phenol-based polymer, positive tone, aqueous developable, low temperature cure and with a high resolution (up to AR of 1:3).
Keywords
dielectric materials; optical polymers; permittivity; 2.5D interposers; cost of ownership; damascene technology; dielectric constant; electrical performances; insulating spin-on dielectric materials; loss tangent; low temperature cure; phenol-based polymer; photosensitive materials; redistribution layers; semiadditive copper-polymer RDL process; wafer bowing; wide I/O 2; wiring density; Dielectrics; Electrical resistance measurement; Metals; Polymers; Resistance; Routing;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics System-Integration Technology Conference (ESTC), 2014
Conference_Location
Helsinki
Type
conf
DOI
10.1109/ESTC.2014.6962789
Filename
6962789
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