• DocumentCode
    160092
  • Title

    Semi-additive Cu-polymer RDL process for interposers applications

  • Author

    Duval, F.F.C. ; Detalle, Mikael ; Sun, Xinghua ; Beyne, Eric ; Neve, Cesar Roda ; Velenis, Dimitrios

  • Author_Institution
    Imec, Leuven, Belgium
  • fYear
    2014
  • fDate
    16-18 Sept. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    This paper explores the possibility to use insulating spin-on dielectric materials for 2.5D interposers. Up to 7 photosensitive materials have been investigated in terms of minimum line/space and via resolution to determine the maximum wiring density. In addition the electrical performances of the best materials were assessed in DC and RF to extract the dielectric constant and loss tangent. Finally the polymer semi-additive process was compared to a Damascene technology using the Wide I/O 2 as case study. The overall performances of each technology are assessed in terms of electrical performances, cost of ownership and wafer bowing. It was shown that the semiadditive process can compete with a conventional Damascene process. The best performing material is a phenol-based polymer, positive tone, aqueous developable, low temperature cure and with a high resolution (up to AR of 1:3).
  • Keywords
    dielectric materials; optical polymers; permittivity; 2.5D interposers; cost of ownership; damascene technology; dielectric constant; electrical performances; insulating spin-on dielectric materials; loss tangent; low temperature cure; phenol-based polymer; photosensitive materials; redistribution layers; semiadditive copper-polymer RDL process; wafer bowing; wide I/O 2; wiring density; Dielectrics; Electrical resistance measurement; Metals; Polymers; Resistance; Routing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference (ESTC), 2014
  • Conference_Location
    Helsinki
  • Type

    conf

  • DOI
    10.1109/ESTC.2014.6962789
  • Filename
    6962789