Title :
A high resolution temperature detection circuit
Author :
Liao, Shu-Xian ; Lin, Zhi-Ming
Author_Institution :
Grad. Inst. of Integrated Circuit Design, Nat. Changhua Univ. of Educ., Changhua, Taiwan
Abstract :
This paper presents a temperature detection circuit implemented in 0.35-μm CMOS fabrication process. Different from the conventional circuits, we use a voltage-to-frequency converter to replace the traditional Analog-to-Digital converter (ADC). With the voltage-to-frequency converter, the resolution is improved. Simulation results show that the proposed architecture can reach a resolution less than 0.1 °C with ± 0.01 °C errors for sensing ranges between -40 °C and 125 °C.
Keywords :
CMOS integrated circuits; temperature sensors; voltage-frequency convertors; CMOS fabrication process; analog-to-digital converter; errors; high resolution temperature detection circuit; size 0.35 mum; temperature -40 degC to 125 degC; voltage-to-frequency converter; CMOS integrated circuits; Detectors; Radiation detectors; Temperature measurement; Temperature sensors; Voltage-controlled oscillators;
Conference_Titel :
Information, Communications and Signal Processing (ICICS) 2011 8th International Conference on
Conference_Location :
Singapore
Print_ISBN :
978-1-4577-0029-3
DOI :
10.1109/ICICS.2011.6173518
