DocumentCode :
1601222
Title :
The Seebeck effect in highly conductive mu c-Ge:H films and its application to sensors
Author :
Kodato, S. ; Kuroda, K. ; Naito, Y.
Author_Institution :
Anritsu Corp., Kanagawa, Japan
fYear :
1991
Firstpage :
908
Lastpage :
911
Abstract :
By combining a plasma CVD (chemical vapor deposition) system with a real-time annealing monitoring system, a highly conductive mu c-Ge:H film has been successfully fabricated on a glass substrate. This film generates a large amount of thermoelectric power (maximum -420 mu V/K). Using this microcrystalline Ge:H film thermopile, an optical power sensor and thermal vacuum gauge have been developed. In particular, when this mu c-Ge:H thermopile was used together with a low-reflectance Ni-P optical absorber, a high-accuracy, quick-response laser beam power sensor with the following characteristics was realized: responsivity, 0.3 mV/mW; response time, 1.8 s; wavelength range, 0.4 to 1.8 mu m; diameter of active area, 6 mm phi ; and resistance, 600 Omega to 1 k Omega .<>
Keywords :
Seebeck effect; annealing; detectors; elemental semiconductors; germanium; integrated circuit technology; optical variables measurement; plasma CVD; plasma CVD coatings; power measurement; semiconductor technology; semiconductor thin films; thermoelectric effects in semiconductors and insulators; thermopiles; vacuum gauges; 0.4 to 1.8 micron; 1.8 s; 6 micron; 600 ohm to 1 kohm; Ge:H-SiO/sub 2/; Ni-P optical absorber; Seebeck effect; glass substrate; laser beam power sensor; microcrystalline Ge:H film thermopile; optical power sensor; plasma CVD; real-time annealing monitoring; semiconductor; thermal vacuum gauge; thermoelectric power; Annealing; Chemical vapor deposition; Conductive films; Optical films; Optical sensors; Plasma chemistry; Real time systems; Sensor phenomena and characterization; Thermal sensors; Thermoelectricity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Sensors and Actuators, 1991. Digest of Technical Papers, TRANSDUCERS '91., 1991 International Conference on
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-87942-585-7
Type :
conf
DOI :
10.1109/SENSOR.1991.149034
Filename :
149034
Link To Document :
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