Title :
A broadband high-dynamic time-domain system for EMI measurements in K-Band up to 26 GHz
Author :
Hoffmann, C. ; Russer, P.
Author_Institution :
Inst. for High Freq. Eng., Tech. Univ. Munchen, Munich, Germany
Abstract :
In this work, a low-noise, high-dynamic time-domain EMI measurement system that allows for measurements from 9 kHz - 26 GHz is presented. It combines ultra-fast analog-to-digital-conversion and real-time digital signal processing on a field-programmable-gate-array (FPGA) with ultra-broadband multi-stage down-conversion. The system IF dynamic range is shown to exceed the requirements of CISPR 16-1-1 by over 20 dB and allows for the measurement of high-dynamic range signals like radar pulses. The system sensitivity is increased by the use of low-loss components and integrated, broadband low-noise amplifiers (LNA). This yields an ultra-low noise floor power spectral density of typically below -150 dBm/Hz over the complete frequency range. The high system sensitivity allows for the characterization of broadband, low-level signals near the noise floor, like ultra-wideband (UWB) communication. Scan time is decreased by several orders of magnitude compared to heterodyne EMI receivers. A scan from 9 kHz to 26 GHz with a 9 kHz IF filter and a dwell-time of 100 ms is completed in under 200 s, while over 5-106 frequency points are calculated.
Keywords :
analogue-digital conversion; field programmable gate arrays; filters; low noise amplifiers; radiofrequency interference; radiofrequency measurement; CISPR 16-1-1; FPGA; IF dynamic range; IF filter; K-Band; broadband high dynamic time-domain system; field programmable gate array; frequency 9 GHz to 26 GHz; low noise EMI measurement system; low noise amplifier; real-time digital signal processing; ultra broadband multi stage down conversion; ultrafast analog-to-digital-conversion; Broadband communication; Dynamic range; Electromagnetic interference; Frequency measurement; Noise; Noise measurement; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
978-1-4577-0812-1
DOI :
10.1109/ISEMC.2011.6038361