• DocumentCode
    160145
  • Title

    Numerical analysis of the performance of highly oriented pyrolytic graphite heat spreader in thermal management of microelectronics assemblies

  • Author

    Tilford, T. ; Cook, Alan ; Lu, Hai-Han ; Ramambasoa, A. ; Conseil, F.

  • Author_Institution
    Univ. of Greenwich, London, UK
  • fYear
    2014
  • fDate
    16-18 Sept. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    An inverse analysis approach combining numerical and experimental analyses has been utilised to determine the in-situ effective material properties of Highly Oriented Pyrolytic Graphite (HOPG) in a microelectronics test assembly. The approach adopted uses a Finite Element analysis package to determine temperature distribution over a thermal test assembly. A Virtual Design of Experiments approach is used to define a series of analyses with discrete thermal material properties which is used in conjunction with a particle swarm optimisation algorithm to form a response surface function relating temperature to material property values at a number of monitoring points. Experimental data is used to form an error metric which is subsequently minimised to determine effective material properties of the HOPG material. Subsequently a series of studies contrasting the performance of the HOPG material with common heat spreader materials were performed. Results show that the effective thermal property values of the HOPG material seem to be greater than suggested in existing literature and that the HOPG material reduces peak assembly temperatures by a significant amount.
  • Keywords
    finite element analysis; graphite; integrated circuit packaging; integrated circuit testing; microassembling; temperature distribution; thermal management (packaging); thermal properties; HOPG material; discrete thermal material properties; error metric; finite element analysis package; heat spreader materials; highly oriented pyrolytic graphite heat spreader performance; in-situ effective material properties; inverse analysis approach; microelectronics test assembly; monitoring points; numerical analysis; particle swarm optimisation algorithm; response surface function; temperature distribution; thermal management; thermal test assembly; virtual design of experiments approach; Assembly; Heating; Material properties; Temperature distribution; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference (ESTC), 2014
  • Conference_Location
    Helsinki
  • Type

    conf

  • DOI
    10.1109/ESTC.2014.6962815
  • Filename
    6962815