• DocumentCode
    160146
  • Title

    Drawbacks of the nanoparticle reinforced lead-free BGA solder joints

  • Author

    Huayu Sun ; Chan, Y.C.

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, Hong Kong, China
  • fYear
    2014
  • fDate
    16-18 Sept. 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In this study, 0.5 wt.% CNTs-doped solder paste, that prepared by mechanical stirring, was used to detect the redistribution phenomenon of nanoparticles in the solder ball. Some of nanoparticles seriously separated out with the outward flow of solder flux, making related quantitative experiments loss their accuracy. Some of nanoparticles seriously gathered in the solder ball, having negative effects on the solder joint and making the phenomenon of degradation of reinforcement become serious. To study the degradation phenomenon of nanoparticle reinforced solder joint, mechanical properties of Sn58Bi, Sn57.6Bi0.4Ag and doped Sn58Bi+0.4Ag were compared during aging. According to the result of ball shear test, the degradation of reinforcement was seriously happened in the doped Sn58Bi+0.4Ag solder joints. Caused by the gathered Ag3Sn IMCs, the doped Sn58Bi+0.4Ag solder joints lost its mechanical advantages after 100h aging, comparing with Sn58Bi and Sn57.6Bi0.4Ag solder joints.
  • Keywords
    ball grid arrays; bismuth alloys; nanoparticles; silver alloys; solders; tin alloys; CNTs-doped solder paste; IMCs; SnBiAg; aging; ball shear test; mechanical properties; mechanical stirring; nanoparticle reinforced lead-free BGA solder joints; nanoparticle reinforced solder joint phenomenon degradation; quantitative experiment loss; redistribution phenomenon detection; solder ball; solder flux outward flow; time 100 h; Aging; Degradation; Lead; Mechanical factors; Nanoparticles; Soldering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics System-Integration Technology Conference (ESTC), 2014
  • Conference_Location
    Helsinki
  • Type

    conf

  • DOI
    10.1109/ESTC.2014.6962816
  • Filename
    6962816