Title :
Fully roll-to-roll gravure printed carbon nanotube based flexible thin film transistor backplane on 100 m of poly(ethyleneterephtalate) (PET) web
Author :
Wookyu Lee ; Hyunmo Koo ; Junfeng Sun ; Yunchang Choi ; Gyoujin Cho
Author_Institution :
Dept. of Printed Electron. Eng., Sunchon Nat. Univ. Sunchon, Sunchon, South Korea
Abstract :
R2R gravure with two printing units with the overlay printing registration accuracy of ±20 μm is introduced to fabricate 20 × 20 TFTs backplane on 150 m of PET web. The resultants of fully printed TFT backplanes were characterized based on the concept to extract the scalability for manufacturing wall paper like sensor sheets. In this gravure system, silver nanoparticle based conductive ink, BaTiO3 based dielectric ink and single walled carbon nanotube based semiconducting ink were used for printing 20 × 20 TFT backplanes on 100 m of PET web. Rheological properties were optimized with the consideration of printing reliability and electrical properties of resulting TFTs. Mobility, transconductance, threshold voltage, and on-off current ratio of 20 × 20 printed TFT backplanes were analyzed for extracting the parameters to define the scalability factors for practical applications.
Keywords :
barium compounds; carbon nanotube field effect transistors; conducting materials; dielectric materials; electric properties; flexible electronics; nanoparticles; semiconductor device reliability; thin film transistors; BaTiO3; PET; R2R gravure; dielectric ink; electrical properties; flexible thin film transistor backplane; fully printed TFT backplanes; fully roll-to-roll gravure printed carbon nanotube; on-off current ratio; overlay printing registration accuracy; poly(ethyleneterephtalate) web; printing reliability; printing units; rheological properties; scalability factors; sensor sheets; silver nanoparticle based conductive ink; single walled carbon nanotube based semiconducting ink; threshold voltage; transconductance; wall paper manufacturing; Backplanes; Cameras; Ink; Positron emission tomography; Printing; Scalability; Thin film transistors;
Conference_Titel :
Electronics System-Integration Technology Conference (ESTC), 2014
Conference_Location :
Helsinki
DOI :
10.1109/ESTC.2014.6962824