DocumentCode
160179
Title
Prediction of mechanical properties on zinc system alloys and their application to high temperature lead-free solder
Author
Zhefeng Xu ; Matsugi, Kazuhiro ; Yongbum Choi ; Terada, Kenji ; Suetsugu, Ken-ichiro
Author_Institution
Dept. of Mechanica l Mater. Eng., Hiroshima Univ., Higashi-Hiroshima, Japan
fYear
2014
fDate
16-18 Sept. 2014
Firstpage
1
Lastpage
3
Abstract
The effectiveness of the electronic parameter was evaluated in order to predict the mechanical properties of zinc system alloys for high temperature application. Firstly, the relation of ultimate tensile strength or elongation and s-orbital energy level (Δ Mk) of already reported Zn system multicomponent alloys were investigated. According to this relation, the lead-free Zn-Al-Sn system alloys have been proposed in order to satisfy both the tensile strength of 200 MPa and elongation of 5 %. Promising compositions of alloys were Zn-4Al-7Sn, Zn-10Al-0.5Sn and Zn-10Al-2Sn in mass % and their Δ Mk values were 0.079, 0.080 and 0.089, respectively. Proposed alloys showed tensile strength of 195-225 MPa depending on increment of Δ Mk values, and elongation of 4.5-5.1 %. The optimization of compositions on Zn alloys was found to be speedy and precisely achieved using the Δ Mk parameter. The proposed alloys also showed liquidus temperatures of 645-700K, indicating that the high temperature lead-free solders can be applied for power semiconductor devices packages, etc. In addition, the contact angles between Cu plate and the proposed alloys Zn-4Al-7Sn, Zn-10Al-0.5Sn and Zn-10Al-2Sn at 973 K in the Ar stream are 33.8°, 73.5°and 50.1°, respectively.
Keywords
aluminium alloys; elongation; solders; tensile strength; tin alloys; zinc alloys; Zn-Al-Sn; electronic parameter; elongation; high temperature lead-free solder; mechanical property prediction; power semiconductor devices packages; pressure 195 MPa to 225 MPa; s-orbital energy level; system multicomponent alloys; temperature 645 K to 973 K; ultimate tensile strength; zinc system alloys; Lead; Solids; Temperature; Temperature measurement; Tin; Zinc;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics System-Integration Technology Conference (ESTC), 2014
Conference_Location
Helsinki
Type
conf
DOI
10.1109/ESTC.2014.6962830
Filename
6962830
Link To Document