DocumentCode :
1601835
Title :
Atomic-scale study of scattering and electronic properties of CVD graphene grain boundaries
Author :
Koepke, Justin C. ; Wood, Joshua D. ; Estrada, David ; Ong, Zhun-Yong ; Xiong, Feng ; Pop, Eric ; Lyding, Joseph W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of lIIinois at Urbana-Champaign, Urbana, IL, USA
fYear :
2012
Firstpage :
1
Lastpage :
4
Abstract :
Chemical vapor deposition growth of graphene on polycrystalline copper foil is a demonstrated technique for obtaining large-area, predominantly monolayer graphene. However, such growth results in grain boundaries between rotationally misoriented graphene grains. We employ scanning tunneling microscopy and spectroscopy to examine the electronic properties of grain boundaries (GBs) and scattering off them in polycrystalline graphene grown by chemical vapor deposition on Cu foil and transferred to SiO2 substrates. Spectroscopy shows enhanced empty states tunneling conductance for most of the GBs and a shift towards more n-type doping compared to the bulk of the graphene. Fourier analysis of the electronic superstructure patterns adjacent to GBs indicates that backscattering and intervalley scattering are the dominant mechanisms, leading to the mobility reduction in the presence of GBs in CVD-grown graphene.
Keywords :
chemical vapour deposition; elemental semiconductors; grain boundaries; graphene; monolayers; scanning tunnelling microscopy; semiconductor thin films; surface scattering; CVD graphene grain boundaries; Fourier analysis; atomic scale study; chemical vapor deposition; electronic superstructure patterns; enhanced empty state tunneling conductance; grain boundary electronic properties; graphene CVD growth; large area monolayer graphene; n-type doping; polycrystalline copper foil; rotationally misoriented graphene grains; scanning tunneling microscopy; scattering properties; silica substrates; spectroscopy; Atomic layer deposition; Electronic mail; Laboratories; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location :
Birmingham
ISSN :
1944-9399
Print_ISBN :
978-1-4673-2198-3
Type :
conf
DOI :
10.1109/NANO.2012.6322107
Filename :
6322107
Link To Document :
بازگشت