DocumentCode :
1601840
Title :
Improving Yield on RF-CMOS ICs
Author :
Herrera, Alfredo ; Jato, Yolanda
Author_Institution :
Dept. of Commun. Eng., Univ. de Cantabria, Santander, Spain
fYear :
2013
Firstpage :
237
Lastpage :
240
Abstract :
One of the industry sectors with the largest revenue in the telecommunication field is the wireless communications field. Wireless operators try to offer products that fulfill the user demands in terms of price, battery life and product quality. All these requirements must be also fulfilled by the designer of the MMIC (Microwave Monolithic Integrated Circuits) circuits that will be used in those wireless terminals, achieving a reliable design, with high performance, low cost and if possible in one or two foundry iterations so as to bring the product out to the market as soon as possible. Silicon based technologies are the lowest cost ones. These technologies don´t include some essential components for the design of RF circuits, which leads to measurement results quite different from those simulated. The deep study of the problems presented when designing Si based RF circuits recommends the use of electromagnetic simulation or coo-simulation tools. The paper shows different simulation techniques that help the designer to obtain better designs with a lower cost, as well as reduced foundry iterations.
Keywords :
CMOS integrated circuits; MMIC; circuit simulation; integrated circuit design; integrated circuit yield; radiofrequency integrated circuits; MMIC; RF circuits; RF-CMOS IC; Si; battery life; co-simulation tools; electromagnetic simulation; foundry iterations; microwave monolithic integrated circuits; product quality; silicon based technologies; telecommunication field; user demands; wireless communications field; wireless operators; wireless terminals; Electromagnetics; Impedance; Integrated circuit modeling; Layout; Microstrip; Radio frequency; Semiconductor device modeling; CMOS; EM-circuit cosimulation; Yield;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices (CDE), 2013 Spanish Conference on
Conference_Location :
Valladolid
Print_ISBN :
978-1-4673-4666-5
Electronic_ISBN :
978-1-4673-4667-2
Type :
conf
DOI :
10.1109/CDE.2013.6481386
Filename :
6481386
Link To Document :
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