Title :
Robust solder joint attachment of coaxial cable leads to piezoelectric ceramic electrodes
Author_Institution :
Sandia Nat. Lab., Albuquerque, NM, USA
Abstract :
A technique is developed for the solder attachment of coaxial cable leads to the silver-bearing thick film electrodes on piezoelectric ceramics. Soldering the cable leads directly to the thick film causes bonds with low mechanical strength due to poor solder joint geometry. A barrier coating of 1.5-μm Cu/1.5-μm Ni/1.0-μm Sn deposited on the thick film layer improves the strength of the solder joints by eliminating the absorption of Ag from the thick film which is responsible for the improper solder joint geometry. The procedure does not require special preparation of the electrode surface and is cost-effective due to the use of non-precious metal films and the batch processing capabilities of the electron beam deposition technique
Keywords :
coaxial cables; electrodes; electron beam deposition; soldering; Cu-Ni-Sn-Ag; barrier coating; batch processing; coaxial cable leads; electrode surface; electron beam deposition; joint geometry; mechanical strength; piezoelectric ceramic electrodes; solder joint attachment; solder joint geometry; Ceramics; Coatings; Coaxial cables; Electrodes; Geometry; Lead; Mechanical cables; Robustness; Soldering; Thick films;
Conference_Titel :
Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
Conference_Location :
Hershey, PA
Print_ISBN :
0-7803-0476-4
DOI :
10.1109/FREQ.1992.269961