Title :
Increased surface resistance of rough copper surfaces in the terahertz regime
Author :
Kirley, M.P. ; Booske, John H.
Author_Institution :
Univ. of Wisconsin-Madison, Madison, WI, USA
Abstract :
Previous study on the surface resistivity of copper surfaces measured at 400 and 650 GHz has been extended to 850 GHz. These measurements were conducted using a high quality factor quasi-optical hemispherical resonator. The measurements of the surface resistance of rough metallic surfaces and the effect of roughness on reflectivity will be discussed. The results will be compared with measurements from theoretical predictions.
Keywords :
copper; reflectivity; rough surfaces; surface resistance; surface roughness; Cu; factor quasioptical hemispherical resonator; frequency 400 GHz; frequency 650 GHz; frequency 850 GHz; reflectivity; rough metallic surfaces; surface resistance; surface resistivity; surface roughness; terahertz regime; Electrical resistance measurement; Metals; Rough surfaces; Surface resistance; Surface roughness; Surface treatment; Surface waves;
Conference_Titel :
Plasma Science (ICOPS), 2013 Abstracts IEEE International Conference on
Conference_Location :
San Francisco, CA
DOI :
10.1109/PLASMA.2013.6635222
