• DocumentCode
    1602209
  • Title

    A new functional test program generation methodology

  • Author

    Fallah, Farzan ; Takayama, Koichiro

  • Author_Institution
    Fujitsu Labs. of America Inc, Sunnyvale, CA, USA
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    76
  • Lastpage
    81
  • Abstract
    This paper introduces a new method for manually generating test programs to validate a processor design. Current manual methods do not utilize high level of abstraction for describing test programs and lack many important features like reusability, incremental validation, and test program compaction; they also work on a formal model specifically developed for validation purposes. To solve the above problems, we use test specification expressions to describe test programs and generate test sequences based on an instruction-set description of a processor written for synthesis purposes. We provide experimental results of generating test programs for several processors to show the effectiveness of our method
  • Keywords
    formal specification; functional programming; instruction sets; performance evaluation; software architecture; functional test program; instruction-set description; processor validation; test specification; test specification expressions; Assembly; Automatic testing; Compaction; Design methodology; Digital systems; Manuals; Process design; Productivity; Test pattern generators; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2001. ICCD 2001. Proceedings. 2001 International Conference on
  • Conference_Location
    Austin, TX
  • ISSN
    1063-6404
  • Print_ISBN
    0-7695-1200-3
  • Type

    conf

  • DOI
    10.1109/ICCD.2001.955006
  • Filename
    955006