DocumentCode
1602209
Title
A new functional test program generation methodology
Author
Fallah, Farzan ; Takayama, Koichiro
Author_Institution
Fujitsu Labs. of America Inc, Sunnyvale, CA, USA
fYear
2001
fDate
6/23/1905 12:00:00 AM
Firstpage
76
Lastpage
81
Abstract
This paper introduces a new method for manually generating test programs to validate a processor design. Current manual methods do not utilize high level of abstraction for describing test programs and lack many important features like reusability, incremental validation, and test program compaction; they also work on a formal model specifically developed for validation purposes. To solve the above problems, we use test specification expressions to describe test programs and generate test sequences based on an instruction-set description of a processor written for synthesis purposes. We provide experimental results of generating test programs for several processors to show the effectiveness of our method
Keywords
formal specification; functional programming; instruction sets; performance evaluation; software architecture; functional test program; instruction-set description; processor validation; test specification; test specification expressions; Assembly; Automatic testing; Compaction; Design methodology; Digital systems; Manuals; Process design; Productivity; Test pattern generators; Writing;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer Design, 2001. ICCD 2001. Proceedings. 2001 International Conference on
Conference_Location
Austin, TX
ISSN
1063-6404
Print_ISBN
0-7695-1200-3
Type
conf
DOI
10.1109/ICCD.2001.955006
Filename
955006
Link To Document