DocumentCode :
1602209
Title :
A new functional test program generation methodology
Author :
Fallah, Farzan ; Takayama, Koichiro
Author_Institution :
Fujitsu Labs. of America Inc, Sunnyvale, CA, USA
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
76
Lastpage :
81
Abstract :
This paper introduces a new method for manually generating test programs to validate a processor design. Current manual methods do not utilize high level of abstraction for describing test programs and lack many important features like reusability, incremental validation, and test program compaction; they also work on a formal model specifically developed for validation purposes. To solve the above problems, we use test specification expressions to describe test programs and generate test sequences based on an instruction-set description of a processor written for synthesis purposes. We provide experimental results of generating test programs for several processors to show the effectiveness of our method
Keywords :
formal specification; functional programming; instruction sets; performance evaluation; software architecture; functional test program; instruction-set description; processor validation; test specification; test specification expressions; Assembly; Automatic testing; Compaction; Design methodology; Digital systems; Manuals; Process design; Productivity; Test pattern generators; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design, 2001. ICCD 2001. Proceedings. 2001 International Conference on
Conference_Location :
Austin, TX
ISSN :
1063-6404
Print_ISBN :
0-7695-1200-3
Type :
conf
DOI :
10.1109/ICCD.2001.955006
Filename :
955006
Link To Document :
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