DocumentCode
1602218
Title
Lateral field excitation and coupled modes in AT quartz: synchrotron radiation X-ray topography
Author
Capelle, B. ; Detaint, J. ; Schwartzel, J. ; Zheng, Y. ; Zarka, A.
Author_Institution
Univ. Pierre et Marie Curie, Paris, France
fYear
1992
Firstpage
553
Lastpage
560
Abstract
Using the synchrotron radiation delivered by a DCI storage ring, plano convex AT resonators excited by a lateral field are studied by the X-ray topography technique. Different overtones and anharmonics of the three types of the thickness modes are observed. Coupled modes in fundamental AT plane resonators are shown and the reasons for their appearance are analyzed
Keywords
X-ray diffraction examination of materials; crystal resonators; piezoelectric oscillations; vibrations; AT quartz; SiO2; anharmonics; coupled modes; lateral field excitation crystal resonators; overtones; plano convex AT resonators; synchrotron radiation X-ray topography; thickness modes; Coordinate measuring machines; Coupled mode analysis; Couplings; Resonance; Storage rings; Surface topography; Synchrotron radiation; Visualization; X-ray diffraction; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
Conference_Location
Hershey, PA
Print_ISBN
0-7803-0476-4
Type
conf
DOI
10.1109/FREQ.1992.269969
Filename
269969
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