• DocumentCode
    1602218
  • Title

    Lateral field excitation and coupled modes in AT quartz: synchrotron radiation X-ray topography

  • Author

    Capelle, B. ; Detaint, J. ; Schwartzel, J. ; Zheng, Y. ; Zarka, A.

  • Author_Institution
    Univ. Pierre et Marie Curie, Paris, France
  • fYear
    1992
  • Firstpage
    553
  • Lastpage
    560
  • Abstract
    Using the synchrotron radiation delivered by a DCI storage ring, plano convex AT resonators excited by a lateral field are studied by the X-ray topography technique. Different overtones and anharmonics of the three types of the thickness modes are observed. Coupled modes in fundamental AT plane resonators are shown and the reasons for their appearance are analyzed
  • Keywords
    X-ray diffraction examination of materials; crystal resonators; piezoelectric oscillations; vibrations; AT quartz; SiO2; anharmonics; coupled modes; lateral field excitation crystal resonators; overtones; plano convex AT resonators; synchrotron radiation X-ray topography; thickness modes; Coordinate measuring machines; Coupled mode analysis; Couplings; Resonance; Storage rings; Surface topography; Synchrotron radiation; Visualization; X-ray diffraction; X-ray imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
  • Conference_Location
    Hershey, PA
  • Print_ISBN
    0-7803-0476-4
  • Type

    conf

  • DOI
    10.1109/FREQ.1992.269969
  • Filename
    269969