DocumentCode :
1602254
Title :
Forced vibrations of thickness-flexure, face-shear and face-flexure in rectangular AT-cut quartz plates
Author :
Sekimoto, Hitoshi ; Watanabe, Yasuaki ; NAKAZAWA, Mitsuo
Author_Institution :
Tokyo Metropolitan Univ., Japan
fYear :
1992
Firstpage :
532
Lastpage :
536
Abstract :
The two-dimensional spurious vibrations of thickness-flexure, face-shear and face-flexure in a rectangular AT-cut quartz plate are theoretically studied. The input capacitance characteristics and the equivalent inductance are calculated, and compared with the experimental data
Keywords :
bending; crystal resonators; piezoelectric oscillations; vibrations; SiO2; crystal resonators; equivalent inductance; face-flexure; face-shear; forced vibrations; input capacitance characteristics; quartz plates; rectangular AT-cut; thickness-flexure; two-dimensional spurious vibrations; Boundary conditions; Capacitance-voltage characteristics; Capacitive sensors; Electrical capacitance tomography; Equations; Finite element methods; Frequency; Inductance; Programmable logic arrays; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
Conference_Location :
Hershey, PA
Print_ISBN :
0-7803-0476-4
Type :
conf
DOI :
10.1109/FREQ.1992.269971
Filename :
269971
Link To Document :
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