• DocumentCode
    1602254
  • Title

    Forced vibrations of thickness-flexure, face-shear and face-flexure in rectangular AT-cut quartz plates

  • Author

    Sekimoto, Hitoshi ; Watanabe, Yasuaki ; NAKAZAWA, Mitsuo

  • Author_Institution
    Tokyo Metropolitan Univ., Japan
  • fYear
    1992
  • Firstpage
    532
  • Lastpage
    536
  • Abstract
    The two-dimensional spurious vibrations of thickness-flexure, face-shear and face-flexure in a rectangular AT-cut quartz plate are theoretically studied. The input capacitance characteristics and the equivalent inductance are calculated, and compared with the experimental data
  • Keywords
    bending; crystal resonators; piezoelectric oscillations; vibrations; SiO2; crystal resonators; equivalent inductance; face-flexure; face-shear; forced vibrations; input capacitance characteristics; quartz plates; rectangular AT-cut; thickness-flexure; two-dimensional spurious vibrations; Boundary conditions; Capacitance-voltage characteristics; Capacitive sensors; Electrical capacitance tomography; Equations; Finite element methods; Frequency; Inductance; Programmable logic arrays; Resonance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Frequency Control Symposium, 1992. 46th., Proceedings of the 1992 IEEE
  • Conference_Location
    Hershey, PA
  • Print_ISBN
    0-7803-0476-4
  • Type

    conf

  • DOI
    10.1109/FREQ.1992.269971
  • Filename
    269971
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1602254