DocumentCode :
160232
Title :
Study on influence of silicone encapsulant for ceramic LED package after HTOL test
Author :
Jemin Kim ; Byungjin Ma ; Kwanhun Lee
Author_Institution :
Korea Electron. Technol. Inst., Seongnam, South Korea
fYear :
2014
fDate :
16-18 Sept. 2014
Firstpage :
1
Lastpage :
4
Abstract :
To estimate influence of silicone encapsulant for ceramic LED package, we prepared silicone samples and ceramic LED packages used encapsulant as the same silicone with neither bonding adhesive nor phosphor. Also, a test jig was designed for high temperature operational life (HTOL) test on ceramic LED packages. The test jig made ceramic LED packages luminous, and was able to guide the light from ceramic LED packages to silicone samples. And then, thermal and optical stress tests on silicone samples were performed with HTOL test on ceramic LED packages in three different temperatures to compare the transmittance of the silicone samples according to the thermal and optical stress from ceramic LED packages. Transmittance of silicone sample and luminous flux of ceramic LED package were measured every 250 hours by UV-VIS spectrophotometer and integrating sphere, respectively. As results, more transmittance variations at 300~400 nm were inspected in silicone samples tested by thermal and optical stresses than by only thermal stress. And, the difference of transmittance characteristics was analyzed to find out how the silicone samples had changed during thermal and optical stress test with Raman analysis. In addition, the luminous flux of ceramic LED package was also changed during HTOL test according to transmittance variations in silicone samples.
Keywords :
Raman spectra; adhesive bonding; ceramic packaging; encapsulation; light emitting diodes; phosphors; silicones; spectrophotometers; spectrophotometry; thermal stresses; HTOL testing; Raman analysis; UV-VIS spectrophotometer; bonding adhesive; ceramic LED packaging; high temperature operational life testing; integrating sphere; luminous flux measurement; optical stress testing; phosphor; silicone encapsulant; silicone samples transmittance; test jig design; thermal stress testing; time 250 hour; wavelength 300 nm to 400 nm; Bonding; Ceramics; Electronic packaging thermal management; Light emitting diodes; Optical refraction; Stress; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics System-Integration Technology Conference (ESTC), 2014
Conference_Location :
Helsinki
Type :
conf
DOI :
10.1109/ESTC.2014.6962856
Filename :
6962856
Link To Document :
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