Title :
Deep level defects on mono-like and polycrystalline silicon solar cells
Author :
Perez, Ernesto ; Garcia, H. ; Castan, H. ; Duenas, S. ; Bailon, L. ; Moralejo, B. ; Martinez, Oscar ; Jimenez, Joaquin ; Parra, Victor
Author_Institution :
Dipt. de Electr. y Electron., Univ. de Valladolid, Valladolid, Spain
Abstract :
Defects on mono-like and polycrystalline silicon solar cells are studied in depth. These defects are in the basis of the higher quantum efficiency of mono-like solar cells (~18%) with respect to polycrystalline ones (~16%). Using the thermal admittance spectroscopy technique we found that both of them have a deep level due to a Fe-B complex. Furthermore, the deep level in the first one (224meV) is shallower than in the second one (345meV). Shallower deep levels degrade less the efficiency on solar cells, so this characteristic of the deep level in the mono-like solar cells leads to a better results in efficiency.
Keywords :
boron; crystal defects; deep levels; elemental semiconductors; iron; silicon; solar cells; spectroscopy; Fe-B; Si; deep level defects; electron volt energy 224 meV; electron volt energy 345 meV; mono-like silicon solar cells; polycrystalline silicon solar cells; thermal admittance spectroscopy technique; Admittance; Capacitance; Frequency measurement; Photovoltaic cells; Silicon; Spectroscopy; Temperature measurement; Solar cell; defects; thermal admittance spectroscopy;
Conference_Titel :
Electron Devices (CDE), 2013 Spanish Conference on
Conference_Location :
Valladolid
Print_ISBN :
978-1-4673-4666-5
Electronic_ISBN :
978-1-4673-4667-2
DOI :
10.1109/CDE.2013.6481405