• DocumentCode
    1602515
  • Title

    Can intentional electrical discharges be used for HPM protection?

  • Author

    Backstrom, M. ; Jordan, U. ; Andersson, Dag ; Kim, A.V. ; Lisak, M. ; Lunden, O.

  • Author_Institution
    Combitech AB, Linköping, Sweden
  • fYear
    2011
  • Firstpage
    752
  • Lastpage
    757
  • Abstract
    The possibility to protect electronics against High Power Microwaves (HPM) using an intentional electrical discharge triggered by the HPM pulse has been investigated. The case considered is a resonant slot, located e.g. in an antenna array or in a Frequency Selective Surface (FSS). The reduction of the pulse energy transmitted through the slot is regarded to be the most important parameter of merit. Experimental and theoretical research showed that a spark in the middle of a 46.3 × 0.1 mm resonant slot, induced by the incident HPM-pulse, gave a reduction of the transmitted pulse energy of about 24 dB. The studies showed that the investigated approach can provide a quite good level of protection that at least reduces the requirements on additional protection components such as limiters integrated in receivers located behind the slot. In order to achieve a sufficiently strong enhancement of the electric field to initiate breakdown in wide slots one presumably has to introduce a small pointed gap in the middle of the slot. This may in turn require that a radioactive sample is located close to the gap in order to produce a sufficient number of seed electrons necessary for triggering the discharge.
  • Keywords
    discharges (electric); frequency selective surfaces; slot antenna arrays; antenna array; electric field enhancement; electrical discharges; electronics; frequency selective surface; high power microwaves protection; limiters; pulse energy reduction; receivers; seed electrons; Apertures; Damping; Discharges; Electric fields; Magnetic domains; Microwave theory and techniques;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
  • Conference_Location
    Long Beach, CA, USA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4577-0812-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2011.6038409
  • Filename
    6038409