• DocumentCode
    1602664
  • Title

    Gate sizing to eliminate crosstalk induced timing violation

  • Author

    Tong Xiao ; Marek-Sadowska, M.

  • Author_Institution
    Sun Microsystems Inc., Palo Alto, CA, USA
  • fYear
    2001
  • Firstpage
    186
  • Lastpage
    191
  • Abstract
    Digital circuits manufactured in deep sub-micron technologies may experience crosstalk-induced delay and noise signals. Crosstalk-induced delay can be quite significant and sensitive to the driver strength of coupling neighbors. In this paper, we propose gate-sizing techniques to reduce delay in presence of crosstalk effects. The techniques are based on our (2001) previously proposed crosstalk aware static timing analysis. Our experiments show that the proposed techniques are effective and may help designers achieve faster timing closure.
  • Keywords
    crosstalk; delays; integrated circuit manufacture; crosstalk-induced delay; delay optimization; functional correlation analysis; gate-sizing method; integrated circuit manufacturing; noise signals; submicron technologies; Capacitance; Crosstalk; Delay estimation; Driver circuits; Integrated circuit interconnections; Libraries; Noise reduction; Semiconductor device noise; Timing; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design, 2001. ICCD 2001. Proceedings. 2001 International Conference on
  • Conference_Location
    Austin, TX, USA
  • ISSN
    1063-6404
  • Print_ISBN
    0-7695-1200-3
  • Type

    conf

  • DOI
    10.1109/ICCD.2001.955023
  • Filename
    955023