Title :
Gate sizing to eliminate crosstalk induced timing violation
Author :
Tong Xiao ; Marek-Sadowska, M.
Author_Institution :
Sun Microsystems Inc., Palo Alto, CA, USA
Abstract :
Digital circuits manufactured in deep sub-micron technologies may experience crosstalk-induced delay and noise signals. Crosstalk-induced delay can be quite significant and sensitive to the driver strength of coupling neighbors. In this paper, we propose gate-sizing techniques to reduce delay in presence of crosstalk effects. The techniques are based on our (2001) previously proposed crosstalk aware static timing analysis. Our experiments show that the proposed techniques are effective and may help designers achieve faster timing closure.
Keywords :
crosstalk; delays; integrated circuit manufacture; crosstalk-induced delay; delay optimization; functional correlation analysis; gate-sizing method; integrated circuit manufacturing; noise signals; submicron technologies; Capacitance; Crosstalk; Delay estimation; Driver circuits; Integrated circuit interconnections; Libraries; Noise reduction; Semiconductor device noise; Timing; Wires;
Conference_Titel :
Computer Design, 2001. ICCD 2001. Proceedings. 2001 International Conference on
Conference_Location :
Austin, TX, USA
Print_ISBN :
0-7695-1200-3
DOI :
10.1109/ICCD.2001.955023