• DocumentCode
    1602736
  • Title

    Statistical link analysis and in-situ characterization of high-speed memory bus in 3D package systems

  • Author

    Oh, D. ; Chang, S. ; Jihong Ren ; Ling Yang ; Hai Lan ; Madden, C. ; Schmitt, R.

  • Author_Institution
    Rambus Inc., Sunnyvale, CA, USA
  • fYear
    2011
  • Firstpage
    797
  • Lastpage
    802
  • Abstract
    High-speed link design in a 3D package system poses unique challenges due to the fact that it provides limited visibility to signal quality and that supply noise induced jitter is large due to a poor power distribution network in a small form factor. This paper outlines a statistical link simulation flow to accurately capture the impact of timing jitter due to power supply noise in 3D systems. The analysis includes on-chip jitter accumulation and link-level jitter tracking by considering both passive channel and on-chip signal path. On-chip measurement techniques which allow in-situ testing of the overall link margin are also described.
  • Keywords
    high-speed integrated circuits; statistical analysis; system-in-package; three-dimensional integrated circuits; timing jitter; 3D package systems; form factor; high-speed link design; high-speed memory bus; in-situ characterization; link-level jitter tracking; on-chip jitter accumulation; on-chip measurement techniques; on-chip signal path; passive channel; power distribution network; power supply noise; signal quality; statistical link analysis; statistical link simulation flow; supply noise induced jitter; timing jitter; Clocks; Jitter; Noise; Power supplies; Random access memory; System-on-a-chip; Three dimensional displays;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility (EMC), 2011 IEEE International Symposium on
  • Conference_Location
    Long Beach, CA, USA
  • ISSN
    2158-110X
  • Print_ISBN
    978-1-4577-0812-1
  • Type

    conf

  • DOI
    10.1109/ISEMC.2011.6038417
  • Filename
    6038417