Title :
Jitter-induced power/ground noise in CMOS PLLs: a design perspective
Author :
Heydari, Payam ; Pedram, Massoud
Author_Institution :
Dept. of Electr. & Comput. Eng., California Univ., Irvine, CA, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
CMOS phase-locked loops (PLL) are ubiquitous in RF and mixed-signal integrated circuits. PLLs are very sensitive to noise fluctuations on the power and ground rails. In this paper, a general comprehensive stochastic model of the power/ground (P/G) noise in VLSI circuits is presented. This is followed by calculation of the phase noise of the voltage-controlled oscillator (VCO) in terms of the statistical properties of supply noise. The PLL timing jitter is predicted in response to the VCO phase noise. Next, the design of a low power, 2.5 V, 0.25 μ CMOS PLL clock generator with a lock range of 100 MHz-400 MHz is described. Our mathematical method is utilized to study the jitter-induced P/G noise in this PLL. A comparison between the results obtained by our mathematical model and those obtained by HSPICE simulation prove the accuracy of the predicted model
Keywords :
CMOS integrated circuits; VLSI; integrated circuit modelling; mixed analogue-digital integrated circuits; phase locked loops; timing jitter; voltage-controlled oscillators; 0.25 micron; 100 to 400 MHz; 2.5 V; CMOS; PLL; VLSI; integrated circuits; mathematical model; phase-locked loop; power ground noise; stochastic model; timing jitter; voltage-controlled oscillator; Fluctuations; Integrated circuit noise; Mathematical model; Mixed analog digital integrated circuits; Phase locked loops; Phase noise; Predictive models; Radio frequency; Rails; Voltage-controlled oscillators;
Conference_Titel :
Computer Design, 2001. ICCD 2001. Proceedings. 2001 International Conference on
Conference_Location :
Austin, TX
Print_ISBN :
0-7695-1200-3
DOI :
10.1109/ICCD.2001.955030