• DocumentCode
    1603028
  • Title

    R&M~CAE implementation issues in electronics development

  • Author

    Anders, David W.

  • Author_Institution
    Northrop Electron. Div., Hawthorne, CA, USA
  • fYear
    1988
  • Firstpage
    17
  • Lastpage
    22
  • Abstract
    Northrop Electronics Division is working to integrate up-front reliability and maintainability (R&M) functions into its computer-aided-engineering (CAE) printed-circuit-board (PCB) development environment. The goal of this effort is to increase overall product quality and decrease overall product cost by decreasing design/development time and promoting optimized tradeoff analysis early in the design cycle. The fundamental barriers to effective integration of R&M~CAE are considered, including: the cultural change that requires some R&M analyses to be performed by the electrical engineer before and during the placement phase; a lack of standard data formats among tools; the inability of some current tools to provide needed data, a lack of automated tradeoff analysis tools; and the unavailability of fast, accurate, and easy-to-use thermal models specifically tailored to PCBs
  • Keywords
    circuit layout CAD; printed circuit design; printed circuit manufacture; quality control; reliability; PCBs; R&M analyses; R&M~CAE; computer-aided-engineering; cultural change; design cycle; design/development time; easy-to-use thermal models; electrical engineer; electronics development; maintainability; optimized tradeoff analysis; placement phase; printed-circuit-board; product cost; product quality; standard data formats; up-front reliability; Aerospace electronics; Computer aided engineering; Data engineering; Design engineering; Integrated circuit reliability; Maintenance engineering; Performance analysis; Printed circuits; Reliability engineering; Thermal engineering;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability in Computer-Aided Engineering Workshop, 1988. R&M - CAE, 1988 Proceedings.
  • Conference_Location
    Leesburgh, VA
  • Type

    conf

  • DOI
    10.1109/RMCAE.1988.95504
  • Filename
    95504