DocumentCode :
1603065
Title :
Bio-inspired scanning for video-imaging using an atomic force microscope
Author :
Qu, Chengeng ; Song, Bo ; Xi, Ning ; Lai, King Wai Chiu ; Yang, Ruiguo ; Chen, Hongzhi
Author_Institution :
Dept. of Electr. & Comput. Eng., Michigan State Univ., East Lansing, MI, USA
fYear :
2012
Firstpage :
1
Lastpage :
5
Abstract :
Atomic Force Microscopy (AFM) is a powerful tool that can perform nano-scale imaging. Normally AFM tip is controlled to scan on sample surface line by line to get the topographic image and this process takes several minutes. Higher sample rate is demanded so that when doing continuous imaging, the time interval between each image can be significantly shorted thus video-imaging can be achieved. In this paper, a compressive sensing based AFM video-imaging system is built, and random walk based scanning path is proposed. Compressive sensing requires random sampling. Bio-inspired random walk based scan path is able to provide a random tip moving path, which enables compressive sensing to be implemented into AFM scanning system. Experiments based on this system are set up in order to test the performance. It first raster scan the entire area and then generate a biased random tip moving path focusing on some specific areas. Compressive scan is then used to continuously scan the sample surface. Finally, video-imaging is achieved and dynamic changes in nano-scale are observed.
Keywords :
atomic force microscopy; bio-inspired materials; compressed sensing; nanotechnology; video signal processing; AFM scanning system; AFM video-imaging system; atomic force microscope; atomic force microscopy; bio-inspired scanning; bioinspired random walk; compressive scan; compressive sensing; continuous imaging; nanoscale imaging; random sampling; random tip moving path; random walk based scanning path; sample rate; scan path; time interval; topographic image; Atomic measurements; Biomedical imaging; Microscopy; Sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location :
Birmingham
ISSN :
1944-9399
Print_ISBN :
978-1-4673-2198-3
Type :
conf
DOI :
10.1109/NANO.2012.6322148
Filename :
6322148
Link To Document :
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