DocumentCode
1603678
Title
Room temperature electrical bonding technique based on titled copper nanowire fastener with anisotropic adhesion properties
Author
Wang, Peng ; Ju, Yang ; Hosoi, Atsuchi ; Song, Yuanhui
Author_Institution
Dept. of Mech. Sci. & Eng., Nagoya Univ., Nagoya, Japan
fYear
2012
Firstpage
1
Lastpage
4
Abstract
This paper presented a room temperature bonding technique based on copper nanowire. A structure with copper nanowire array growing on the patterned areas of the silicon substrate was prepared through template-assistant electro-deposition. Through pressing the tilted and straight nanowire arrays against each other, the van der Waals interactions between the interconnected nanowires resulted in the mechanical bonding and electrical connectivity. This room temperature bonding technique exhibited anisotropic adhesion properties. The maximum adhesive strength of ~ 9.36 N/cm2 and electrical resistance of 0.3 Ω (areas, A~3.14 mm2) were obtained. Hence, it might have important implications for the assembly of components in the micro electronics.
Keywords
adhesion; adhesive bonding; assembling; copper; electric resistance; electrodeposition; interconnections; nanowires; silicon; van der Waals forces; anisotropic adhesion property; component assembly; copper nanowire array; electrical connectivity; electrical resistance; interconnected nanowires; maximum adhesive strength; mechanical bonding; microelectronics; patterned areas; room temperature bonding technique; room temperature electrical bonding technique; silicon substrate; straight nanowire arrays; template-assistant electro-deposition; tilted nanowire arrays; titled copper nanowire fastener; van der Waals interactions; Copper; Electric variables measurement; Mechanical factors; Nanoscale devices; Substrates;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location
Birmingham
ISSN
1944-9399
Print_ISBN
978-1-4673-2198-3
Type
conf
DOI
10.1109/NANO.2012.6322167
Filename
6322167
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