• DocumentCode
    1603809
  • Title

    Development of a Torsional Paddle Microresonator for mass detection

  • Author

    Charandabi, Sahand Chitsaz ; Muhammad, Haseena B. ; Anthony, Carl J. ; Prewett, Philip D.

  • Author_Institution
    Sch. of Mech. Eng., Univ. of Birmingham, Birmingham, UK
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper presents the development of a torsional micro paddle resonator (TPM), designed for mass detection purposes. The system is designed to operate using a lorentz force electromagnetic driving system, which allows the implementation of a contactless actuating mechanism. Finite element simulations were conducted in order to evaluate the effects of positioning suitable magnets and to optimise the magnetic flux across the TPM. The TPM was fabricated from a 200 nm thick silicon nitride substrate using a focused ion beam (FIB) machine. The fabricated device was characterised in an air medium using a laser vibrometer. The device exhibited a Q factor of 1970 in air, which was determined by application of a Lorentzian curve fit to experimental data and a working frequency of about 1 MHz. This is greater than previously reported Q factor values for integrated micro cantilever sensors.
  • Keywords
    curve fitting; finite element analysis; focused ion beam technology; magnetic flux; micromechanical resonators; microsensors; vibration measurement; FIB machine; Lorentz force electromagnetic driving system; Lorentzian curve fit; Q factor; TPM; contactless actuating mechanism; fabricated device; finite element simulation; focused ion beam; laser vibrometer; magnetic flux; mass detection; microcantilever sensor; silicon nitride substrate; size 200 nm; torsional paddle microresonator; Magnetic field measurement; Magnetic sensors; Micromechanical devices; Resonant frequency; Focused Ion Beam Fabrication; MEMS Resonator; Mass Detection; Micropaddle;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
  • Conference_Location
    Birmingham
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4673-2198-3
  • Type

    conf

  • DOI
    10.1109/NANO.2012.6322172
  • Filename
    6322172