Title :
The influence of technological process on properties and reliability of thick film layers
Author :
PelikÁnovÁ, Ivana BeshajovÁ ; Konupka, TomÁs
Author_Institution :
Dept. of Electrotechnol., CTU, Prague, Czech Republic
Abstract :
Thick film layers, and their properties, are the topic of this paper. Attention is paid to thick film resistors and particularly their behavior in connection with the trimming process. The influence of two methods of trimming was investigated and compared. Some samples were trimmed by a milling cutter and other samples were trimmed by laser. The change of resistance and non linearity of C-V characteristics were measured.
Keywords :
circuit reliability; electric resistance; laser beam machining; milling; thick film resistors; C-V characteristics nonlinearities; laser trimming; mechanical trimming; milling cutter; resistance change; thick film layer reliability; thick film layer technological process influence; thick film resistors; trimming process; Capacitance-voltage characteristics; Drilling machines; Electric resistance; Electrical resistance measurement; Laser beam cutting; Linearity; Milling; Resistors; Thick films; Voltage;
Conference_Titel :
Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. 27th International Spring Seminar on
Print_ISBN :
0-7803-8422-9
DOI :
10.1109/ISSE.2004.1490444
