Characterisation of nanoporous materials using Focused Ion Beam milling method

Author

Charandabi, Sahand Chitsaz ; Sabouri, A. ; Ostadi, H. ; Anthony, Carl J. ; Prewett, P.D.

Author_Institution

Sch. of Mech. Eng., Univ. of Birmingham, Birmingham, UK

fYear

2012

Firstpage

1

Lastpage

4

Abstract

Focused Ion Beam (FIB) is generally used for machining of solid and bulk materials. However, new applications such as FIB nanotomography of nanoporous surfaces require sputtering yield characterisation. This paper presents the study of the FIB sputtering yield of Ga⁺ on nanoporous catalyst layers (CL) of a polymer electrolyte fuel cell (PEFC) based on analytical calculations and SEM stereo imaging experiments. It is shown that a porosity of around 50% has a significant effect (approximately 400%) on the sputtering yield of materials.

Keywords

catalysts; focused ion beam technology; milling; nanoporous materials; proton exchange membrane fuel cells; scanning electron microscopy; sputtering; stereo image processing; CL; FIB nanotomography; FIB sputtering; PEFC; SEM stereo imaging experiments; analytical calculations; bulk materials; focused ion beam milling method; nanoporous catalyst layers; nanoporous materials; nanoporous surfaces; polymer electrolyte fuel cell; solid materials; sputtering yield characterisation; Atomic measurements; Cavity resonators; Heating; Substrates; FIB milling; fuel cell catalyst layer; nanoporous materials; sputtering yield; stereo imaging;

fLanguage

English

Publisher

ieee

Conference_Titel

Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on

Conference_Location

Birmingham

ISSN

1944-9399

Print_ISBN

978-1-4673-2198-3

Type

conf

DOI

10.1109/NANO.2012.6322174

Filename

6322174