DocumentCode :
160406
Title :
Workload prediction for adaptive power scaling using deep learning
Author :
Tarsa, Stephen J. ; Kumar, Amit P. ; Kung, H.T.
Author_Institution :
Microarchitectures Res. Lab., Harvard Univ., Santa Clara, CA, USA
fYear :
2014
fDate :
28-30 May 2014
Firstpage :
1
Lastpage :
5
Abstract :
We apply hierarchical sparse coding, a form of deep learning, to model user-driven workloads based on on-chip hardware performance counters. We then predict periods of low instruction throughput, during which frequency and voltage can be scaled to reclaim power. Using a multi-layer coding structure, our method progressively codes counter values in terms of a few prominent features learned from data, and passes them to a Support Vector Machine (SVM) classifier where they act as signatures for predicting future workload states. We show that prediction accuracy and look-ahead range improve significantly over linear regression modeling, giving more time to adjust power management settings. Our method relies on learning and feature extraction algorithms that can discover and exploit hidden statistical invariances specific to workloads. We argue that, in addition to achieving superior prediction performance, our method is fast enough for practical use. To our knowledge, we are the first to use deep learning at the instruction level for workload prediction and on-chip power adaptation.
Keywords :
circuit analysis computing; encoding; feature extraction; learning (artificial intelligence); pattern classification; power aware computing; regression analysis; support vector machines; SVM classifier; adaptive power scaling; deep learning; feature extraction algorithms; hierarchical sparse coding; instruction level; linear regression modeling; low instruction throughput; multilayer coding structure; on-chip hardware performance counters; on-chip power adaptation; power management; statistical invariances; support vector machine; user-driven workloads; workload prediction; Accuracy; Dictionaries; Encoding; Radiation detectors; Throughput; Training; Vectors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IC Design & Technology (ICICDT), 2014 IEEE International Conference on
Conference_Location :
Austin, TX
Type :
conf
DOI :
10.1109/ICICDT.2014.6838580
Filename :
6838580
Link To Document :
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