• DocumentCode
    1604434
  • Title

    Development of mass production system and process for ferroelectric thin films

  • Author

    Suu, Koukou

  • Author_Institution
    Institute for Semiconductor Technologies, ULVAC, Inc., 1220-1 Suyama, Susono, Shizuoka 410-1231, Japan
  • Volume
    2
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    The range of use such as ferroelectric random access non-volatile memories (FeRAM), piezoelectric MEMS devices has been extended greatly by developing the ferroelectric thin film technologies. Especially, the miniaturization of all devices is focused on the low power consumption operation, and various developments are advanced. The most typical material is Pb(Zr,Ti)O3 (PZT), though the control of composition and crystalline of PZT thin films were very difficult so far. Moreover, it greatly influences the process, the back and forth such as upper and lower electrodes and the barrier films. We firstly developed the mass production technologies for FeRAM with the PZT thin film by RF magnetron sputtering, and succeeded in the achievement of uniformity in the wafer, reproducibility and reliability of PZT thin films. Afterwards, the high temperature etching and the MOCVD technology had been developed as next generation FeRAM mass production. Moreover, piezoelectric MEMS mass production technology development has been done at the same time by applying the technology of the mass production sputter tool of FeRAM. Mass production system and processing technology for the ferroelectric devices on both FeRAM and piezoelectric MEMS are introduced.
  • Keywords
    Ferroelectric films; Ferroelectric materials; Mass production; Micromechanical devices; Nonvolatile memory; Piezoelectric devices; Piezoelectric films; Random access memory; Sputtering; Transistors; Dry etching; FeRAM; Ferroelectric; MOCVD; PZT; Sputter; piezoelectric MEMS;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
  • Conference_Location
    Santa Re, NM, USA
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-2744-4
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2008.4693719
  • Filename
    4693719