• DocumentCode
    160458
  • Title

    Design of a voltage reference circuit based on subthreshold and triode MOSFETs in 90nm CMOS

  • Author

    Mohammed, M. ; Abugharbieh, Khaldoon ; Abdelfattah, Moataz ; Kawar, Sanad

  • Author_Institution
    Electr. Eng. Dept., Princess Sumaya Univ. for Technol., Amman, Jordan
  • fYear
    2014
  • fDate
    28-30 May 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This work presents a new design of a precision voltage reference circuit using MOSFET transistor devices operating in the subthreshold region. Also, a triode region MOSFET has been deployed instead of using resistors. The circuit has been designed and simulated in 90 nm CMOS technology. A reference voltage of 281 mV is obtained with Line Sensitivity, LS, of 0.23% in a supply voltage range of (0.8 V-1.65 V). The Temperature Coefficient, TC, is 125 ppm/°C through a temperature range of (0-85) °C The Power Supply Rejection Ratio (PSRR) is -48 dB at 50 Hz and -26 dB at 1 MHz. Finally, the power consumption is 11.31 μW and the coefficient of process variations is 0.29%. The design has been simulated using Synopsys Custom Designer and HSPICE CAD tools.
  • Keywords
    CMOS integrated circuits; MOSFET; reference circuits; triodes; CMOS technology; HSPICE CAD tools; MOSFET transistor device; PSRR; Synopsys Custom Designer; line sensitivity; power 11.31 muW; power consumption; power supply rejection ratio; process variation coefficient; size 90 nm; subthreshold MOSFET; subthreshold region; temperature 0 C to 85 C; temperature coefficient; triode region MOSFET; voltage 0.8 V to 1.65 V; voltage 281 mV; voltage reference circuit; CMOS integrated circuits; MOSFET; Sensitivity; Temperature; Temperature dependence; Temperature sensors; CMOS; process variation; subthreshold; supply voltage; temperature compensation; voltage reference circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    IC Design & Technology (ICICDT), 2014 IEEE International Conference on
  • Conference_Location
    Austin, TX
  • Type

    conf

  • DOI
    10.1109/ICICDT.2014.6838605
  • Filename
    6838605