Title :
RC triggered active ESD clamps; How should they behave under powered conditions?
Author :
Miller, James W. ; Stockinger, Michael ; Ruth, Scott ; Gerdemann, Alex ; Etherton, Melanie ; Moosa, Mohamed
Author_Institution :
Freescale Semicond., Austin, TX, USA
Abstract :
Problems with standard RC clamp circuits during powered system level ESD events are reviewed. A new clamp design is presented which employs a proportional triggering scheme that regulates the pad voltage during transient events, rather than simply switching the clamps fully on or off.
Keywords :
CMOS integrated circuits; RC circuits; electrostatic discharge; integrated circuit design; trigger circuits; LVCMOS product; RC clamp circuit design; RC trigger circuit; RC triggered active ESD clamps; pad voltage; powered system level ESD events; proportional triggering scheme; transient events; Clamps; Electrostatic discharges; Inverters; Logic gates; Rails; Stress; Switches; IEC 61000-4-2; RC clamps; electrostatic discharge; powered ESD; trigger circuit;
Conference_Titel :
IC Design & Technology (ICICDT), 2014 IEEE International Conference on
Conference_Location :
Austin, TX
DOI :
10.1109/ICICDT.2014.6838619
