DocumentCode :
1604830
Title :
Electrical, morphological and electronic properties of inkjet printed PEDOT:PSS
Author :
Wilson, Pete ; Lekakou, Constantina ; Watts, John
Author_Institution :
Univ. of Surrey, Guildford, UK
fYear :
2012
Firstpage :
1
Lastpage :
6
Abstract :
Electrical and morphological properties of inkjet printed (3,4-ethylenedioxythiophene) polystyrene sulfonate (PEDOT:PSS) thin-films samples have been explored using dimethyl sulfoxide as conduction enhancing cosolvent. Room temperature conductivity increased by a factor of 103 to ~140 S cm-1 on the addition of 5% DMSO, Hall probe analysis demonstrated a decrease in contact resistance from 106Ω to 104Ω whilst variable-temperature conductivity analysis shows an increase in VRH exponent from 0.25 to 0.5 signifying a charge transport evolution from Mott Variable Range Hopping in 3-dimensions to a pseudo 1-dimensional Variable Range Hopping. XPS analysis verified an increase in surface PEDOT to PSS ratio from 0.39 (0wt% DMSO) to 0.5 (5wt% DMSO) with an associated increase in PEDOT grain size from 11nm to 31nm, derived from electric field force microscopy. Concurrently the addition of DMSO acted as a foaming suppressor in samples containing the processing additive Surfynol 2502 with pristine samples matching the surface roughness of spin cast references.
Keywords :
X-ray photoelectron spectra; additives; grain size; ink jet printing; microscopy; polymer films; surface roughness; thin films; DMSO; Hall probe analysis; Mott variable range hopping; PEDOT grain size; XPS analysis; additive Surfynol 2502; charge transport evolution; contact resistance; dimethyl sulfoxide; electric field force microscopy; electrical properties; electronic property; inkjet printed (3,4-ethylenedioxythiophene) polystyrene sulfonate thin-films; inkjet printed PEDOT:PSS; morphological properties; pristine sample matching; pseudo one-dimensional variable range hopping; room temperature conductivity; size 11 nm to 31 nm; spin cast references; surface roughness; temperature 293 K to 298 K; variable-temperature conductivity analysis; Probes; Smoothing methods; Spectroscopy;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location :
Birmingham
ISSN :
1944-9399
Print_ISBN :
978-1-4673-2198-3
Type :
conf
DOI :
10.1109/NANO.2012.6322210
Filename :
6322210
Link To Document :
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