DocumentCode :
1604868
Title :
Highly bendable high-mobility graphene field effect transistors with multi-finger embedded gates on flexible substrates
Author :
Lee, Jongho ; Tao, Li ; Parrish, Kristen N. ; Hao, Yufeng ; Ruoff, Rodney S. ; Akinwande, Deji
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of Texas at Austin, Austin, TX, USA
fYear :
2012
Firstpage :
1
Lastpage :
3
Abstract :
A highly bendable, high mobility graphene field-effect transistor with embedded-gate structure is fabricated on commercial polyimide films. Multi-finger configuration consisting of 10 and 18 fingers is used to increase the current drivability. Bendability measurements for the device show that it is fully functional at the bending radius of down to 1.3mm. The shift in the dirac point is less than 0.6V, which is the result from the high uniformity of the grown graphene films and the simplified process minimizing the exposure of graphene to chemicals and the risk of chemical contamination. Plasma enhanced chemical vapor deposited silicon nitride is used as a capping layer to prevent contamination of the device from environments and provides robust protection over exposure to liquids.
Keywords :
contamination; flexible electronics; fullerene devices; graphene; high electron mobility transistors; plasma CVD; silicon compounds; thin film transistors; Bendability measurements; Multi-finger configuration; Plasma enhanced chemical vapor deposited silicon nitride; Si3N4-C; bending radius; chemical contamination; commercial polyimide films; current drivability; dirac point; flexible substrates; graphene films; highly bendable high-mobility graphene field effect transistors; multifinger embedded gates; robust protection; Films; High definition video; Liquids; Mechanical variables measurement; Nitrogen; CVD Graphene; Field-Effect Transistors; Flexible Electronics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location :
Birmingham
ISSN :
1944-9399
Print_ISBN :
978-1-4673-2198-3
Type :
conf
DOI :
10.1109/NANO.2012.6322212
Filename :
6322212
Link To Document :
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