• DocumentCode
    1605058
  • Title

    Piezoelectric RF MEMS switches and phase shifters

  • Author

    Polcawich, Ron ; Judy, Daniel ; Pulskamp, Jeffrey ; Trolier-McKinstry, Susan ; Dubey, Madan

  • Author_Institution
    US Army Research Laboratory, USA
  • Volume
    2
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Piezoelectric thin films were utilized to actuate cantilevers for a radio frequency (RF) microelectromechanical system (MEMS) switches. Using lead zirconate titanate (PZT) thin films, an RF MEMS series switch was designed and fabricated. The switch operates from ??25??C to 100??C with no change in actuation voltage of 9V. The switch isolation is better than ??20 dB and the insertion loss (??S21) less than 0.5 dB from DC to 40 GHz. In addition to improvements in switch performance, a 17 GHz, 2-bit reflection phase shifter has been demonstrated using PZT shunt switches operating at 15 V. Each of the 4 phase states are demonstrated with minimal phase error and an average insertion loss of 6.8 dB with a high of 8 dB for the longest phase state (limited by substrate losses highlighted in our previous work). Correcting the substrate loss reduces the insertion loss of the long phase state to less than 2 dB.
  • Keywords
    Insertion loss; Microelectromechanical systems; Micromechanical devices; Phase shifters; Piezoelectric films; Radio frequency; Radiofrequency microelectromechanical systems; Switches; Titanium compounds; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
  • Conference_Location
    Santa Re, NM, USA
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-2744-4
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2008.4693746
  • Filename
    4693746