• DocumentCode
    1605194
  • Title

    Comparison of two voltage-sharing measures for triple-break vacuum interrupters in series

  • Author

    Shu, Shengwen ; Ruan, Jiangjun ; Huang, Daochun ; Wu, Gaobo

  • Author_Institution
    Sch. of Electr. Eng., Wuhan Univ., Wuhan, China
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Multiple-break vacuum circuit breaker (VCB) has been identified as an effective way to expand from the present low and middle voltage level to high voltage level, where the SF6 gas-blast circuit breaker is widely used. However, in multiple-break VCB in series, the voltage applied to each break does not become equal because of stray capacitance, opening non-synchronously or differences of contact property, which is detrimental to breaking capacity. An enhanced PSCAD/EMTDC model of simulating dielectric recovery process of signal and triple-break vacuum interrupters was developed, whose accuracy was verified by comparing simulation results with test data obtained by Edward Huber. The other research focused on choice of rational voltage sharing measures for triple-break vacuum interrupters. Two voltage-sharing measures for triple-break vacuum interrupters including shunt grading capacitor and metal oxide arrester (MOA) were investigated and compared. It is advised that both shunt grading capacitor and MOA should be considered to be installed.
  • Keywords
    SF6 insulation; arresters; capacitors; gas blast circuit breakers; vacuum circuit breakers; vacuum interrupters; MOA; SF6 gas blast circuit breaker; VCB; metal oxide arrester; shunt grading capacitor; vacuum circuit breaker; vacuum interrupters; voltage sharing measures; Anodes; Artificial neural networks; Capacitance; Cathodes; Indexes; Voltage measurement; AC circuit breaker; grading capacitor; metal oxide arrester; stray capacitance; vacuum interrupters; voltage- sharing measures;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power System Technology (POWERCON), 2010 International Conference on
  • Conference_Location
    Hangzhou
  • Print_ISBN
    978-1-4244-5938-4
  • Type

    conf

  • DOI
    10.1109/POWERCON.2010.5666138
  • Filename
    5666138