Title :
Nonlinear effects in thin-film ferroelectric transmission lines at microwave frequencies
Author :
Booth, James C. ; Orloff, Nathan D. ; Mateu, Jordi M.
Author_Institution :
National Institute of Standards and Technology, Boulder, CO 80302, USA
Abstract :
In order to investigate the switching dynamics of ferroelectric materials at nanosecond time scales, we have measured the nonlinear response of ferroelectric-loaded transmission lines at microwave frequencies. We analyzed the third harmonic and intermodulation products produced by planar transmission lines incorporating ferroelectric thin films, and obtained the rf nonlinear capacitance C(Vrf). We also directly measured the change in capacitance of the same structures due to a dc applied voltage, C(Vdc). By comparing these two experimentally-determined nonlinear capacitances, we are able to directly determine if the mechanisms responsible for the capacitance tuning in these materials are able to responsd on nanosecond time scales.
Keywords :
Capacitance; Ferroelectric materials; Frequency measurement; Microwave frequencies; Microwave measurements; Nanostructured materials; Planar transmission lines; Transistors; Transmission line measurements; Transmission lines;
Conference_Titel :
Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
Conference_Location :
Santa Re, NM, USA
Print_ISBN :
978-1-4244-2744-4
Electronic_ISBN :
1099-4734
DOI :
10.1109/ISAF.2008.4693758