• DocumentCode
    1605272
  • Title

    Nonlinear effects in thin-film ferroelectric transmission lines at microwave frequencies

  • Author

    Booth, James C. ; Orloff, Nathan D. ; Mateu, Jordi M.

  • Author_Institution
    National Institute of Standards and Technology, Boulder, CO 80302, USA
  • Volume
    2
  • fYear
    2008
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In order to investigate the switching dynamics of ferroelectric materials at nanosecond time scales, we have measured the nonlinear response of ferroelectric-loaded transmission lines at microwave frequencies. We analyzed the third harmonic and intermodulation products produced by planar transmission lines incorporating ferroelectric thin films, and obtained the rf nonlinear capacitance C(Vrf). We also directly measured the change in capacitance of the same structures due to a dc applied voltage, C(Vdc). By comparing these two experimentally-determined nonlinear capacitances, we are able to directly determine if the mechanisms responsible for the capacitance tuning in these materials are able to responsd on nanosecond time scales.
  • Keywords
    Capacitance; Ferroelectric materials; Frequency measurement; Microwave frequencies; Microwave measurements; Nanostructured materials; Planar transmission lines; Transistors; Transmission line measurements; Transmission lines;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Applications of Ferroelectrics, 2008. ISAF 2008. 17th IEEE International Symposium on the
  • Conference_Location
    Santa Re, NM, USA
  • ISSN
    1099-4734
  • Print_ISBN
    978-1-4244-2744-4
  • Electronic_ISBN
    1099-4734
  • Type

    conf

  • DOI
    10.1109/ISAF.2008.4693758
  • Filename
    4693758