Title :
RE built-in test and enabling technologies for integrated diagnostics
Author :
Chu, A. ; Cronson, H.M. ; Devine, J.F. ; Soares, S. ; Soloman, M.N. ; Lezec, H.J. ; Musil, C.R.
Author_Institution :
MITRE Corp., Bedford, MA, USA
Abstract :
The authors describe a vision of unambiguous fault isolation on RF equipment and enabling critical technologies. The overall goal is reduction of logistic support and maintenance cost of RF subsystems. Savings will be achieved through reduced false alarms, troubleshooting, false removal rates, spares inventory, and support equipment. The authors describe technology developments in miniature sources and signal analyzers with examples of built-in test (BIT) implementations utilizing specifically designed monolithic microwave integrated circuits (MMICs). These emerging technologies applied to integrated diagnostics can result in substantial cost avoidance in maintenance, spares inventory, and support equipment.<>
Keywords :
MMIC; automatic test equipment; built-in self test; economics; electronic equipment testing; integrated circuit testing; maintenance engineering; microwave generation; microwave measurement; spectral analysers; BIT; RE built-in test; RF equipment; built-in test; cost avoidance; false alarms; false removal rates; fault isolation; integrated diagnostics; maintenance; miniature sources; monolithic microwave integrated circuits; planar frequency tunable Gunn devices; signal analyzers; spares inventory; support equipment; troubleshooting; Built-in self-test; Circuit faults; Costs; Integrated circuit technology; Isolation technology; Logistics; MMICs; Microwave technology; Radio frequency; Signal analysis;
Conference_Titel :
AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record
Conference_Location :
Dayton, OH, USA
Print_ISBN :
0-7803-0643-0
DOI :
10.1109/AUTEST.1992.270112
