RE built-in test and enabling technologies for integrated diagnostics

Author

Chu, A. ; Cronson, H.M. ; Devine, J.F. ; Soares, S. ; Soloman, M.N. ; Lezec, H.J. ; Musil, C.R.

Author_Institution

MITRE Corp., Bedford, MA, USA

fYear

1992

Firstpage

207

Lastpage

211

Abstract

The authors describe a vision of unambiguous fault isolation on RF equipment and enabling critical technologies. The overall goal is reduction of logistic support and maintenance cost of RF subsystems. Savings will be achieved through reduced false alarms, troubleshooting, false removal rates, spares inventory, and support equipment. The authors describe technology developments in miniature sources and signal analyzers with examples of built-in test (BIT) implementations utilizing specifically designed monolithic microwave integrated circuits (MMICs). These emerging technologies applied to integrated diagnostics can result in substantial cost avoidance in maintenance, spares inventory, and support equipment.<>

Keywords

MMIC; automatic test equipment; built-in self test; economics; electronic equipment testing; integrated circuit testing; maintenance engineering; microwave generation; microwave measurement; spectral analysers; BIT; RE built-in test; RF equipment; built-in test; cost avoidance; false alarms; false removal rates; fault isolation; integrated diagnostics; maintenance; miniature sources; monolithic microwave integrated circuits; planar frequency tunable Gunn devices; signal analyzers; spares inventory; support equipment; troubleshooting; Built-in self-test; Circuit faults; Costs; Integrated circuit technology; Isolation technology; Logistics; MMICs; Microwave technology; Radio frequency; Signal analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record

Conference_Location

Dayton, OH, USA

Print_ISBN

0-7803-0643-0

Type

conf

DOI

10.1109/AUTEST.1992.270112

Filename

270112