DocumentCode :
1605595
Title :
Analysis of avalanche regime in InP HBT´s using physical simulation implementation in a DC model
Author :
Maneux, C. ; Martin, J.-C. ; Labat, N. ; Touboul, A. ; Riet, M. ; Kahn, M. ; Godin, J.
Author_Institution :
CNRS Univ. Bordeaux, Talence, France
Volume :
3
fYear :
2004
Firstpage :
1249
Abstract :
This paper deals with the investigation of collector current Ic increase in InP/InGaAs/InP HBT designed for rapid digital signal processing in optical fibre telecommunication systems. Indeed, at high base-collector voltage, carrier generation by impact ionization as well as carrier tunnelling mechanisms in the multi-layer collector initiate Ic increase previous to the avalanche regime. Then, the characterisation of DC operation at low level injection allows to extract parameters which are included in a Gummel-Poon model modified to consider the impact ionisation influence. The physical simulation leads to identify parasitic elements as a current source accounting for carrier multiplication.
Keywords :
III-V semiconductors; current collecting equipment; gallium compounds; heterojunction bipolar transistors; indium compounds; integrated optoelectronics; ionisation; optical communication equipment; optical fibre communication; signal processing; DC model; Gummel-Poon model; InP-InGaAs; avalanche regime; base-collector voltage; carrier multiplication; carrier tunnelling mechanisms; collector current; digital signal processing; heterojunction bipolar junctions; impact ionization; multilayer collector; optical fibre telecommunication systems; Analytical models; Digital signal processing; Heterojunction bipolar transistors; Impact ionization; Indium gallium arsenide; Indium phosphide; Optical design; Optical fibers; Signal design; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Technology, 2004. IEEE ICIT '04. 2004 IEEE International Conference on
Print_ISBN :
0-7803-8662-0
Type :
conf
DOI :
10.1109/ICIT.2004.1490740
Filename :
1490740
Link To Document :
بازگشت