DocumentCode :
1605600
Title :
Predicting Software Anomalies Using Machine Learning Techniques
Author :
Alonso, Javier ; Belanche, Lluís ; Avresky, Dimiter R.
Author_Institution :
Dept. of Comput. Archit., Tech. Univ. of Catalonia, Barcelona, Spain
fYear :
2011
Firstpage :
163
Lastpage :
170
Abstract :
In this paper, we present a detailed evaluation of a set of well-known Machine Learning classifiers in front of dynamic and non-deterministic software anomalies. The system state prediction is based on monitoring system metrics. This allows software proactive rejuvenation to be triggered automatically. Random Forest approach achieves validation errors less than 1% in comparison to the well-known ML algorithms under a valuation. In order to reduce automatically the number of monitored parameters, needed to predict software anomalies, we analyze Lasso Regularization technique jointly with the Machine Learning classifiers to evaluate how the prediction accuracy could be guaranteed within an acceptable threshold. This allows to reduce drastically (around 60% in the best case) the number of monitoring parameters. The framework, based on ML and Lasso regularization techniques, has been validated using an ecommerce environment with Apache Tomcat server, and MySql database server.
Keywords :
decision trees; learning (artificial intelligence); pattern classification; program diagnostics; software maintenance; software metrics; Apache Tomcat server; Lasso regularization technique; MySql database server; decision tree; ecommerce; machine learning classifier; nondeterministic software anomaly; random forest approach; software anomaly prediction; software proactive rejuvenation; system metric monitoring; system state prediction; Computer crashes; Instruction sets; Machine learning algorithms; Monitoring; Prediction algorithms; Predictive models; Machine Learning; Software Anomalies; Software Rejuvenation; Software aging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Network Computing and Applications (NCA), 2011 10th IEEE International Symposium on
Conference_Location :
Cambridge, MA
Print_ISBN :
978-1-4577-1052-0
Electronic_ISBN :
978-0-7695-4489-2
Type :
conf
DOI :
10.1109/NCA.2011.29
Filename :
6038598
Link To Document :
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