DocumentCode
1605840
Title
Knowledge-based diagnostic systems for avionics
Author
Davis, James F. ; Goodaker, Andrew W. ; McDowell, James K. ; Abdallah, Mohamed
Author_Institution
Dept. of Chem. Eng., Ohio State Univ., Columbus, OH, USA
fYear
1992
Firstpage
73
Lastpage
78
Abstract
A knowledge-based approach for diagnosis of electronic circuits in avionics systems is discussed. The knowledge-based methodology is generic and was designed for accurate and efficient identification of malfunctioning circuit components in diagnostic situations involving single-component malfunctions, multiple independent malfunctions, and multiple interacting malfunctions. The resulting methodology integrates the features of two knowledge-based techniques. Hierarchical classification (HC), a compiled knowledge approach, is used to efficiently identify single and multiple malfunctions. An approach called diagnostically focused simulation, which refines the HC results with causal reasoning, is then used to resolve whether multiple malfunctions are the result of independent component failures or whether an interaction exists that relates the malfunction behaviors. A generally-applicable shell incorporating the methodology was developed in a commercial software package and applied to the development of a diagnostic system for a black and white television circuit.<>
Keywords
aerospace computing; aircraft instrumentation; automatic test equipment; diagnostic expert systems; failure analysis; fault location; knowledge based systems; television equipment; avionics; black and white television circuit; causal reasoning; component failures; diagnostic systems; diagnostically focused simulation; efficient identification; electronic circuits; hierarchical classification; knowledge-based methodology; knowledge-based techniques; malfunctioning circuit components; multiple malfunctions; shell; software package; Aerospace electronics; Application software; Artificial intelligence; Chemical engineering; Circuit simulation; Design methodology; Electronic circuits; Knowledge acquisition; Laboratories; Software packages;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record
Conference_Location
Dayton, OH, USA
Print_ISBN
0-7803-0643-0
Type
conf
DOI
10.1109/AUTEST.1992.270130
Filename
270130
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