• DocumentCode
    1605840
  • Title

    Knowledge-based diagnostic systems for avionics

  • Author

    Davis, James F. ; Goodaker, Andrew W. ; McDowell, James K. ; Abdallah, Mohamed

  • Author_Institution
    Dept. of Chem. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    1992
  • Firstpage
    73
  • Lastpage
    78
  • Abstract
    A knowledge-based approach for diagnosis of electronic circuits in avionics systems is discussed. The knowledge-based methodology is generic and was designed for accurate and efficient identification of malfunctioning circuit components in diagnostic situations involving single-component malfunctions, multiple independent malfunctions, and multiple interacting malfunctions. The resulting methodology integrates the features of two knowledge-based techniques. Hierarchical classification (HC), a compiled knowledge approach, is used to efficiently identify single and multiple malfunctions. An approach called diagnostically focused simulation, which refines the HC results with causal reasoning, is then used to resolve whether multiple malfunctions are the result of independent component failures or whether an interaction exists that relates the malfunction behaviors. A generally-applicable shell incorporating the methodology was developed in a commercial software package and applied to the development of a diagnostic system for a black and white television circuit.<>
  • Keywords
    aerospace computing; aircraft instrumentation; automatic test equipment; diagnostic expert systems; failure analysis; fault location; knowledge based systems; television equipment; avionics; black and white television circuit; causal reasoning; component failures; diagnostic systems; diagnostically focused simulation; efficient identification; electronic circuits; hierarchical classification; knowledge-based methodology; knowledge-based techniques; malfunctioning circuit components; multiple malfunctions; shell; software package; Aerospace electronics; Application software; Artificial intelligence; Chemical engineering; Circuit simulation; Design methodology; Electronic circuits; Knowledge acquisition; Laboratories; Software packages;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record
  • Conference_Location
    Dayton, OH, USA
  • Print_ISBN
    0-7803-0643-0
  • Type

    conf

  • DOI
    10.1109/AUTEST.1992.270130
  • Filename
    270130