Title :
BENeFITS - A step to ATE of the future
Author :
Ross, William A. ; Hernandez, J. Luis
Author_Institution :
US Naval Air Systems Command, Washington, DC, USA
Abstract :
The authors discuss the results of a proof-of-concept effort aimed at defining an automatic test equipment (ATE) architecture that incorporates both built-in-test (BIT) data and functional testing techniques. The concept, called BENeFITS (BIT-Enhanced Functional Test System), uses fault guided analysis techniques to process BIT failure data retrieved from the unit under test and perform functional testing only on the sections indicated by BIT. Other features include the use of software algorithms and artificial intelligence (AI) principles to improve fault callout accuracies over time.<>
Keywords :
artificial intelligence; automatic test equipment; built-in self test; diagnostic expert systems; military computing; military systems; AI; ATE; BENeFITS; BIT failure data; BIT-Enhanced Functional Test System; DOD; NAVAIR; Navy; artificial intelligence; automatic test equipment; built-in-test; fault callout accuracies; fault guided analysis; functional testing; prototype; software algorithms; Algorithm design and analysis; Automatic test equipment; Computer architecture; Costs; Failure analysis; Fault detection; Information retrieval; Instruments; Prototypes; System testing;
Conference_Titel :
AUTOTESTCON '92. IEEE Systems Readiness Technology Conference, Conference Record
Conference_Location :
Dayton, OH, USA
Print_ISBN :
0-7803-0643-0
DOI :
10.1109/AUTEST.1992.270140
