• DocumentCode
    1606599
  • Title

    Power efficiency of switch architecture extensions for fault tolerant NoC design

  • Author

    Ghiribaldi, Alberto ; Strano, Alessandro ; Favalli, Michele ; Bertozzi, Davide

  • Author_Institution
    ENDIF, Univ. of Ferrara, Ferrara, Italy
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    The increasingly parallel landscape of embedded computing platforms is bringing the reliability concern for the on-chip interconnection network (NoC) to the forefront. While very few works in the open literature bring their error recovery mechanisms down to microarchitectural and physical implementation, this paper documents the effort of optimizing a baseline NoC switch architecture for different fault-tolerant strategies against single-event upsets. As key contributions achieved, we not only come up with a new efficient fault-tolerant flow control protocol, but also we contrast correction vs. retransmission oriented switch microarchitectures, each implementing both data and control path protection, with physical implementation awareness. The accuracy of the analysis methodology enables us to report counterintuitive power-reliability trade-offs between the design points, serving as guidelines for implementing fault-tolerant communication in a power-constrained environment.
  • Keywords
    circuit reliability; fault tolerant computing; integrated circuit design; network-on-chip; ault-tolerant flow control protocol; contrast correction; counterintuitive power-reliability trade-offs; error recovery mechanisms; fault tolerant NoC design; on-chip interconnection network; power efficiency; retransmission oriented switch microarchitectures; single-event upsets; switch architecture extensions; Clocks; Computer architecture; Fault tolerance; Fault tolerant systems; Protocols; Switches; Tunneling magnetoresistance; Fault-tolerance; Network-on-Chip;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Green Computing Conference (IGCC), 2012 International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    978-1-4673-2155-6
  • Electronic_ISBN
    978-1-4673-2153-2
  • Type

    conf

  • DOI
    10.1109/IGCC.2012.6322281
  • Filename
    6322281