Title :
Set of Electrical Characteristic Parameters Suitable for Reliability Analysis of Multimegabit Phase Change Memory Arrays
Author :
Chimenton, A. ; Zambelli, C. ; Olivo, P. ; Pirovano, A.
Author_Institution :
Dipt. di Ing., Univ. degli Studi di Ferrara, Ferrara
Abstract :
In this paper we define a set of few electrical parameters aimed at giving a complete picture of the phase change memory array behavior during writing/reading operations. A wide spectrum of information can be extracted, thus providing helpful indicators for process optimization. The degree of statistical dispersion, the shape of the distributions and the presence of anomalous cells can be easily extracted from fully automated testing measurements.
Keywords :
random-access storage; statistical analysis; electrical parameter; phase change memory array; statistical dispersion; Current measurement; Data mining; Electric variables; Performance evaluation; Phase change materials; Phase change memory; Phased arrays; Pulse measurements; Semiconductor device measurement; Voltage;
Conference_Titel :
Non-Volatile Semiconductor Memory Workshop, 2008 and 2008 International Conference on Memory Technology and Design. NVSMW/ICMTD 2008. Joint
Conference_Location :
Opio
Print_ISBN :
978-1-4244-1546-5
Electronic_ISBN :
978-1-4244-1547-2
DOI :
10.1109/NVSMW.2008.20
